Relation between Dielectric Characteristics at Low Frequency and Degradation of Printed Wiring Board by Ionic Migration

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ژورنال

عنوان ژورنال: IEEJ Transactions on Fundamentals and Materials

سال: 1999

ISSN: 0385-4205,1347-5533

DOI: 10.1541/ieejfms1990.119.3_365